A multiscale wavelet algorithm for atom tracking in STM movies

Abstract High-speed scanning tunneling microscopy (STM) data have become available that provide movies of time-dependent surface processes. To track adsorbed atoms and molecules in such automatic routines are required. We introduce a multiresolution wavelet particle detection algorithm for this purpose. identify the particles, images decomposed by means discrete transform into planes different resolutions. An ‘à trous’ low-pass filter is applied. The coefficients from filtered to remove noise. Wavelet with significant particles multiplied, product transformed binary mask. precision method tested sets CO O on Ru(0001) surface. can safely detect localize these high precision, even presence enhanced noise characteristic high-speed, constant-height STM data. By linking positions, we obtain extended trajectories resolution ∼0.5 Å or better allowing us investigate detailed motion single